V-Probes Holdings Co., Ltd delivers high quality Cantilever / Epoxy Probe Cards that average a higher number of “touchdowns”.

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 V-Probes Holdings Co., Ltd delivers high quality Cantilever / Epoxy Probe Cards that average a higher number of “touchdowns”.

V-Probes Holdings Co., Ltd delivers high quality Cantilever / Epoxy Probe Cards that average a higher number of “touchdowns”.

Cantilever / Epoxy Probe Cards

V-Probes Holdings Co., Ltd delivers high quality Cantilever / Epoxy Probe Cards that average a higher number of “touchdowns”.

From single to multi-die configurations, V-Probes consistently delivers high probe count Probe Cards within 10 working days.

100% of our projects are tested on our state-of-the-art Probe Card Analyzers and are guaranteed to match the X,Y coordinates supplied with our client’s design input data.

Quality is #1 at V-Probes. Our workmanship is guaranteed!

 

Semiconductor wafer testing has stringent performance requirements. Shrinking geometries, pad pitch, scrub targets, and other issues, including: contact resistance, high/low temperatures, etc., are continually challenging Probe Card manufacturers to adopt new approaches in order to achieve superior performance.

Vertical Probe Cards

Semiconductor wafer testing has stringent performance requirements.  Shrinking geometries, pad pitch, scrub targets, and other issues, including: contact resistance, high/low temperatures, etc., are continually challenging Probe Card manufacturers to adopt new approaches in order to achieve superior performance.

V-Probes Holdings Co., Ltd is continually expanding our investment in R&D in order to meet our client’s evolving technical requirements.  As a result, V-Probes consistently delivers high quality Vertical and Cantilever / Epoxy Probe Cards that average a higher number of touchdowns.  The benefit to our clients are significantly reduced wafer test costs.

V-Probes Holdings Co., Ltd provides Cobra Vertical Probe Cards. Our Probe Cards provide the following advantages:

  • High-pin densities
  • Easy replacement of probes
  • Balanced contact performance
  • Pitch down to 60 µm
  • Test Temperatures from -20 °C to 160 °C
  • Beam diameter: 2mil, 2.5mil, 3mil, etc.

Address: ANNA Building, 1st Floor, Quang Trung Software City, Tan Chanh Hiep Ward, District 12, Ho Chi Minh, Viet Nam

Tel: (848) 5437-1078                  Fax:(848) 5437-1079

Email:contact@v-probes.com

Address: 830 Jury Court, Suite 4, San Jose, CA 95112, U.S.A.
Tel: (408) 464-3757         Fax:(408) 884-2317
Email: susan_perez@v-probes.com

SW HI-TECH TRADING SDN BHD ( Co#: 45350U ) Office and Service Center

Address: No. 1415 Lorong Perusahaan 1 Kawasan, Perindustrian Prai, 13600 Prai, Penang, Malaysia

Tel: +604 3985515         Fax:+604 3985515

Email:sale@swtech-asia.com

Address: Unit 506 South Gate Buiding, Finace Drive Madrigal Business Park, Ayala Alabang Muntinlupa City, Philipines 1780
Tel: +63 842 32 08              Fax:+63 842 32 08

SW TECHNOLOGY PTE LTD ( Co Reg: 199409147G )

Address: 19 Kim Keat Road #04-03 Fu Tsu Building Singapore 328804

Tel: +65 6254-3733         Fax: +65 6251-1324

Email:sales@swtechnology.com.sg

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